Dr. Michael Huebner

Responsible for: • PCBA design and layout for Memory and SOC probe cards (all FormFactor Probe BU products) • Circuit design and component development for ATRE (Advanced Tester Resource Enhancement) • CAD development for design tools used for PCB design and other automation tasks (e.g. firmware generation/customization) • Document control and Engineering services

- Leading a worldwide distributed engineering team developing test solutions to increase parallelism or test coverage for semiconductor wafer test. These solutions referred to as Advanced TRE (Tester Resource Enhancement) use customized electronic circuits on probe cards consisting of in house developed custom ASICs as well as commercially available components. In most cases FPGAs and Microcontroller are used to control these circuits through the test program.

Responsible for new product strategies and ideas. Managing customer engagements on new probing/testing solutions.

Managing the wafer test cluster for Memory product devision of Infineon Technologies (now: Qimonda AG) consiting of wafer test floors all over the world. Main focus: Productivity improvement programs, ensure availibility of test hardware needed for product ramp, sychronization of processes, best practice sharing, technical responsiblity for new probe card technologies and wafer test equipment in general, development of new test concepts.

Measurement techniques Ultra low temperature Physics